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Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM /
Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction...
| Cote: | Libro Electrónico |
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| Auteur principal: | |
| Collectivité auteur: | |
| Format: | Électronique eBook |
| Langue: | Inglés |
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New York, NY :
Springer US : Imprint: Springer,
2005.
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| Édition: | 1st ed. 2005. |
| Sujets: | |
| Accès en ligne: | Texto Completo |