Matching Properties of Deep Sub-Micron MOS Transistors

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermor...

Full description

Bibliographic Details
Call Number:Libro Electrónico
Main Authors: Croon, Jeroen A. (Author), Sansen, Willy M. (Author), Maes, Herman E. (Author)
Corporate Author: SpringerLink (Online service)
Format: Electronic eBook
Language:Inglés
Published: New York, NY : Springer US : Imprint: Springer, 2005.
Edition:1st ed. 2005.
Series:The Springer International Series in Engineering and Computer Science ; 851
Subjects:
Electronic circuits.
Physics.
Astronomy.
Electronics.
Engineering.
Electrical engineering.
Electronic Circuits and Systems.
Physics and Astronomy.
Electronics and Microelectronics, Instrumentation.
Technology and Engineering.
Electrical and Electronic Engineering.
Online Access:Texto Completo

Internet

Texto Completo

Items no disponibles

Holdings details from

Similar Items