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Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.
Quantitative Data Processing in Scanning Probe Microscopy: SPM Applications for Nanometrology, Second Edition describes the recommended practices for measurements and data processing for various SPM techniques, also discussing associated numerical techniques and recommendations for further reading f...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Diego :
Elsevier Science,
2018.
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| Edición: | 2nd ed. |
| Colección: | Micro & nano technologies.
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| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Intro; Title page; Table of Contents; Copyright; List of Contributors; Preface to the Second Edition; Preface to the First Edition; Chapter 1: Motivation; Abstract; 1.1. Why �a#x80;#x9C;Quantitative�a#x80;#x9D; Scanning Probe Microscopy?; 1.2. What Is Scanning Probe Microscopy?; 1.3. Basic Metrology Concepts; 1.4. Scanning Probe Microscopy and Quantitative Measurements; References; Chapter 2: Instrumentation Principles; Abstract; 2.1. Few Components for a Price of a House?; 2.2. Novel Approaches; References; Chapter 3: Data Models; Abstract; 3.1. From Analog to Digital; 3.2. Data Acquisition Basics
- 3.3. Image Sampling3.4. Data Storage; 3.5. Mechanical and Thermal Drifts; 3.6. Noise; 3.7. Try It Yourself; 3.8. Tips and Tricks; References; Chapter 4: Basic Data Processing; Abstract; 4.1. A Daily Bread?; 4.2. Data Visualization; 4.3. Local Data Manipulation; 4.4. Global Data Manipulation; 4.5. Multiple Channel Operations; 4.6. Scripting; 4.7. Data Generation; 4.8. Other Freely Available Data Processing Software; 4.9. Uncertainty Related to Data Processing; 4.10. Try It Yourself; 4.11. Tips and Tricks; References; Chapter 5: Dimensional Measurements; Abstract; 5.1. The Easiest Measurement?
- 5.2. Atomic Force Microscopy Principles5.3. Atomic Force Microscopy Dimensional Data Measurement and Evaluation; 5.4. Atomic Force Microscopy and Quantitative Dimensional Metrology; 5.5. Try It Yourself; 5.6. Tips and Tricks; References; Chapter 6: Force and Mechanical Properties; Abstract; 6.1. What About Forces in Force Microscopy?; 6.2. Forces and Force�a#x80;#x93;Distance Curves; 6.3. Force Interaction Modeling; 6.4. Quantitative Force Measurements; 6.5. Local Mechanical and Material Properties Mapping; 6.6. Try It Yourself; 6.7. Tips and Tricks; References; Chapter 7: Friction and Lateral Forces
- Abstract7.1. What Opposes the Tip Motion?; 7.2. Friction Forces; 7.3. Force Modeling; 7.4. Quantitative Friction Force Measurements; 7.5. Special Modes; 7.6. Try It Yourself; 7.7. Tips and Tricks; References; Chapter 8: Electrostatic Fields; Abstract; 8.1. What Is Above the Sample? See the Invisible!; 8.2. Basic Relations; 8.3. Numerical Modeling; 8.4. Try It Yourself; 8.5. Tips and Tricks; References; Chapter 9: Magnetic Fields; Abstract; 9.1. Magnetic Field Measurements; 9.2. Try It Yourself; 9.3. Tips and Tricks; References; Chapter 10: Local Current Measurements; Abstract
- 10.1. Where It All Started10.2. Tip�a#x80;#x93;Sample Junction Models; 10.3. Scanning Tunneling Microscopy and Related Methods; 10.4. Conductive Atomic Force Microscopy; 10.5. Piezoresponse Force Microscopy; 10.6. Scanning Electrochemical Microscopy; 10.7. Try It Yourself; 10.8. Tips and Tricks; References; Chapter 11: Thermal Measurements; Abstract; 11.1. Really a Hot Topic?; 11.2. Nano- and Microscale Heat Flow; 11.3. Instrumentation; 11.4. Data Interpretation; 11.5. Try It Yourself; 11.6. Tips and Tricks; References; Chapter 12: Optical Measurements; Abstract; 12.1. Have a Look at Nanoscale