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Reliability prediction from burn-in data fit to reliability models /
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability pu...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
London [England] :
Elsevier,
2014.
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| Temas: | |
| Acceso en línea: | Texto completo |