Cargando…

Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2 /

Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defec...

Descripción completa

Detalles Bibliográficos
Clasificación:	Libro Electrónico
Autor Corporativo:	International Conference on the Science and Technology of Defect Control in Semiconductors Yokohama-shi, Japan
Otros Autores:	Sumino, K. (K�oji), 1931-
Formato:	Electrónico Congresos, conferencias eBook
Idioma:	Inglés
Publicado:	Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990.
Temas:	Semiconductors > Defects > Congresses. Materials > Defects > Congresses. Semi-conducteurs > D�efauts > Congr�es. Mat�eriaux > D�efauts > Congr�es. Materials > Defects Semiconductors > Defects Congress proceedings (reports) Conference papers and proceedings Conference papers and proceedings. Actes de congr�es.
Acceso en línea:	Texto completo

Ejemplares similares

Advanced methods in materials processing defects /
Publicado: (1997)

Voids in Materials From Unavoidable Defects to Designed Cellular Materials /
por: Gladysz, Gary M., et al.
Publicado: (2021)

Defects in semiconductors /
Publicado: (2015)

C, H, N and O in Si and Characterization and Simulation of Materials and Processes : Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 /
Publicado: (1996)

Hydrogen in semiconductors : bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990 /
Publicado: (1991)

Semiconductors and semimetals. optical and photothermal characterization /
Publicado: (1997)

Selected Topics in Group IV and II-VI Semiconductors : Proceedings of Symposium L and Symposium D of the 1995 E-Mrs Spring Conference, Strasbourg, France, 22-26 May 1995 /
Publicado: (1996)

Identification of defects in semiconductors.
Publicado: (1998)

Defects, (HgCD)Se, (HgCD)Te /
Publicado: (1981)

Non-stoichiometry in semiconductors : proceedings of Symposium A3 on Non-Stoichiometry in Semiconductors of the International Conference on Advanced Materials--ICAM 91, Strasbourg, France, 27-31 May, 1991 /
Publicado: (1992)

Computational methods for predicting material processing defects : proceedings of the International Conference on Computational Methods for Predicting Material Processing Defects, September 8-11, 1987, Cachan, France /
Publicado: (1987)

Defects in Advanced Electronic Materials and Novel Low Dimensional Structures /
Publicado: (2018)

Identification of defects in semiconductors /
Publicado: (1998)

Properties and microstructure /
Publicado: (1977)

Imperfections in III/V materials /
Publicado: (1993)

Materials processing defects /
Publicado: (1995)

Semiconductor superlattices and interfaces : Varenna on Lake Como, Villa Monastero, 25 June-5 July 1991 /
Publicado: (1993)

Trap level spectroscopy in amorphous semiconductors /
por: Mikla, Victor I.
Publicado: (2010)

Elements of structures and defects of crystalline materials /
por: Fang, Tsang-Tse, 1955-
Publicado: (2018)

Computed electron micrographs and defect identification /
Publicado: (1973)

Semiconductor materials for optoelectronics and LTMBE materials : proceedings of Symposium A on Semiconductor Materials for Optoelectronic Devices, OEICs and Photonics, and Symposium B on Low Temperature Molecular Beam Epitaxial III-V Materials : Physics and Applications, of the E-MRS Spring Conference, Strasbourg, France, May 4-7 1993 /
Publicado: (1993)

Metal fatigue : effects of small defects and nonmetallic inclusions /
por: Murakami, Y. (Yukitaka), 1943-
Publicado: (2019)

Gauge theory and defects in solids /
por: Edelen, Dominic G. B.
Publicado: (1988)

Hot carriers in semiconductors : proceedings of the fifth international conference, 20-24 July 1987, Boston, MA, U.S.A. /
Publicado: (1988)

The physics of MOS insulators : proceedings of the International Topical Conference on the Physics of MOS Insulators, held at the Jane S. McKimmon Conference Center, North Carolina State University Raleigh, North Carolina, June 18-20, 1980 /
Publicado: (1980)

Silicon molecular beam epitaxy : proceedings of the 3rd International Symposium on Silicon Molecular Beam Epitaxy, Symposium A of the 1989 E-MRS Conference, Strasbourg, France, 30 May-2 June 1989 /
Publicado: (1989)

Fault detection, supervision and safety of technical processes 2006 : a proceedings volume from the 6th IFAC symposium, SAFEPROCESS, Beijing, P.R. China, August 30-September 1, 2006 /
Publicado: (2007)

Shallow impurity centers in semiconductors : proceedings of the Second International Conference on Shallow Impurity Centers/Fourth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 28 July-1 August 1986 /
Publicado: (1987)

Laser and electron beam processing of materials /
Publicado: (1980)

High Tc superconductors electronic structure : proceedings of the International Symposium on the Electronic Structure of High Tc Superconductors, Rome, 5-7 October 1988 /
Publicado: (1989)

Innovation for energy efficiency : proceedings of the European conference, Newcastle upon Tyne, UK, 15-17 September 1987 /
Publicado: (1988)

Semiconductor materials analysis and fabrication process control : proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992 /
Publicado: (1993)

Fault detection & reliability : knowledge based & other approaches /
Publicado: (1987)

Hot carriers in semiconductor nanostructures : physics and applications /
Publicado: (1992)

Fracture of polymers, composites, and adhesives /
Publicado: (2000)

Ecomaterials : proceedings of the symposium K: Environment conscious materials of the 3rd IUMRS International Conference on Advanced Materials, Sunshine City, Ikebukuro, Tokyo, Japan, August 31-September 4, 1993 /
Publicado: (1994)

Passivity of metals and semiconductors : proceedings of the Fifth International Symposium on Passivity Bombannes, France, May 30-June 3, 1983 /
Publicado: (1983)

Biomaterials, organic and intelligent materials : proceedings of the Symposia N: biomaterials, O: catalytic materials, Q: ordered polymers, R: photo- and electro-responsive materials, T: biosensors, EE: construction and functions of organic thin films, FF: intelligent materials of the 3rd IUMRS International Conference on Advanced Materials, Sunshine City, Ikebukura, Tokyo, Japan, August 31 - September 4, 1993 /
Publicado: (1994)

Fracture of polymers, composites, and adhesives II /
Publicado: (2003)

Passivation of metals and semiconductors, and properties of thin oxide layers : a selection of papers from the 9th International Symposium, Paris, France, 27 June-1 July 2005 /
Publicado: (2006)

Cannot write session to /tmp/vufind_sessions/sess_0utalr08djbhvqc6vos1sfsmn7