Defect control in semiconductors : proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2 /

Defect control in semiconductors is a key technology for realizing the ultimate possibilities of modern electronics. The basis of such control lies in an integrated knowledge of a variety of defect properties. From this viewpoint, the volume discusses defect-related problems in connection with defec...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: International Conference on the Science and Technology of Defect Control in Semiconductors Yokohama-shi, Japan
Otros Autores: Sumino, K. (K�oji), 1931-
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Amsterdam ; New York : New York, N.Y., U.S.A. : North-Holland ; Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990.
Temas:
Semiconductors > Defects > Congresses.
Materials > Defects > Congresses.
Semi-conducteurs > D�efauts > Congr�es.
Mat�eriaux > D�efauts > Congr�es.
Materials > Defects
Semiconductors > Defects
Congress
proceedings (reports)
Conference papers and proceedings
Conference papers and proceedings.
Actes de congr�es.
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