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Machine learning for high-risk applications : approaches to responsible AI /

The past decade has witnessed the broad adoption of artificial intelligence and machine learning (AI/ML) technologies. However, a lack of oversight in their widespread implementation has resulted in some incidents and harmful outcomes that could have been avoided with proper risk management. Before...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Hall, Patrick (Autor), Curtis, James (Autor), Pandey, Parul (Autor)
Otros Autores: Sudjianto, Agus (writer of foreword.)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Sebastopol, CA : O'Reilly Media, Inc., 2023.
Edición:[First edition].
Temas:
Acceso en línea:Texto completo (Requiere registro previo con correo institucional)