Reliability and failure of electronic materials and devices /
"Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus...
Clasificación: | Libro Electrónico |
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Autor principal: | Ohring, Milton, 1936- |
Otros Autores: | Kasprzak, Lucian |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Amsterdam ; Boston :
Academic Press is an imprint of Elsevier,
2014.
|
Edición: | Second edition. |
Temas: | |
Acceso en línea: | Texto completo (Requiere registro previo con correo institucional) |
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