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Reliability and failure of electronic materials and devices /

"Reliability and Failure of Electronic Materials and Devices is a well-established and well-regarded reference work offering unique, single-source coverage of most major topics related to the performance and failure of materials used in electronic devices and electronics packaging. With a focus...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Ohring, Milton, 1936-
Otros Autores: Kasprzak, Lucian
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam ; Boston : Academic Press is an imprint of Elsevier, 2014.
Edición:Second edition.
Temas:
Acceso en línea:Texto completo (Requiere registro previo con correo institucional)