Cargando…
Testing for small-delay defects in nanoscale CMOS integrated circuits /
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality is...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Boca Raton :
CRC Press, Taylor & Francis Group,
[2014]
|
| Colección: | Devices, circuits, and systems.
|
| Temas: | |
| Acceso en línea: | Texto completo (Requiere registro previo con correo institucional) |
MARC
| LEADER | 00000cam a2200000Ii 4500 | ||
|---|---|---|---|
| 001 | OR_ocn859916982 | ||
| 003 | OCoLC | ||
| 005 | 20231017213018.0 | ||
| 006 | m o d | ||
| 007 | cr bn||||||||| | ||
| 008 | 131011s2014 flua ob 001 0 eng d | ||
| 010 | |a 2013028538 | ||
| 040 | |a CUS |b eng |e rda |e pn |c CUS |d YDXCP |d TXA |d WAU |d UIU |d VLB |d HF7 |d COO |d N$T |d CRCPR |d OCLCQ |d UIU |d E7B |d UMI |d OCLCF |d DEBBG |d EBLCP |d DEBSZ |d OCLCQ |d PIFBY |d OTZ |d UAB |d OCLCQ |d BUF |d OCLCQ |d CEF |d U3W |d NLE |d OCLCQ |d UKMGB |d WYU |d TYFRS |d LEAUB |d AU@ |d OCLCQ |d UKAHL |d OCLCQ |d VT2 |d RCE |d OCLCO |d OCLCQ |d SFB |d OCLCQ | ||
| 015 | |a GBB7D1472 |2 bnb | ||
| 016 | 7 | |a 018434828 |2 Uk | |
| 019 | |a 862821943 |a 863056098 |a 868971304 |a 900292029 |a 1058523436 |a 1066051317 |a 1129342879 | ||
| 020 | |a 9781439829424 |q (electronic bk.) | ||
| 020 | |a 143982942X |q (electronic bk.) | ||
| 020 | |z 9781439829417 |q (hardcover ; |q alk. paper) | ||
| 020 | |z 1439829411 |q (hardcover ; |q alk. paper) | ||
| 020 | |a 1315217813 | ||
| 020 | |a 9781315217819 | ||
| 029 | 1 | |a AU@ |b 000055921213 | |
| 029 | 1 | |a DEBBG |b BV042490646 | |
| 029 | 1 | |a DEBSZ |b 431494916 | |
| 029 | 1 | |a DEBSZ |b 43483825X | |
| 029 | 1 | |a GBVCP |b 882739328 | |
| 029 | 1 | |a NZ1 |b 15342455 | |
| 029 | 1 | |a UKMGB |b 018434828 | |
| 035 | |a (OCoLC)859916982 |z (OCoLC)862821943 |z (OCoLC)863056098 |z (OCoLC)868971304 |z (OCoLC)900292029 |z (OCoLC)1058523436 |z (OCoLC)1066051317 |z (OCoLC)1129342879 | ||
| 037 | |a CL0500000527 |b Safari Books Online | ||
| 050 | 4 | |a TK7871.99.M44 |b T43 2014eb | |
| 072 | 7 | |a TEC |x 009070 |2 bisacsh | |
| 082 | 0 | 4 | |a 621.39/732 |2 23 |
| 049 | |a UAMI | ||
| 245 | 0 | 0 | |a Testing for small-delay defects in nanoscale CMOS integrated circuits / |c edited by Sandeep K. Goel, Krishnendu Chakrabarty. |
| 264 | 1 | |a Boca Raton : |b CRC Press, Taylor & Francis Group, |c [2014] | |
| 264 | 4 | |c ©2014 | |
| 300 | |a 1 online resource (xv, 247 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Devices, circuits, and systems | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics. | |
| 520 | |a Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay. | ||
| 546 | |a English. | ||
| 590 | |a O'Reilly |b O'Reilly Online Learning: Academic/Public Library Edition | ||
| 650 | 0 | |a Metal oxide semiconductors, Complementary |x Testing. | |
| 650 | 6 | |a MOS complémentaires |x Essais. | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Mechanical. |2 bisacsh | |
| 650 | 7 | |a Metal oxide semiconductors, Complementary |x Testing. |2 fast |0 (OCoLC)fst01017645 | |
| 700 | 1 | |a Goel, Sandeep K., |e editor. | |
| 700 | 1 | |a Chakrabarty, Krishnendu, |e editor. | |
| 776 | 0 | 8 | |i Print version: |t Testing for small-delay defects in nanoscale CMOS integrated circuits. |d Boca Raton : CRC Press, 2014 |z 9781439829417 |w (DLC) 2013028538 |w (OCoLC)441142171 |
| 830 | 0 | |a Devices, circuits, and systems. | |
| 856 | 4 | 0 | |u https://learning.oreilly.com/library/view/~/9781439829417/?ar |z Texto completo (Requiere registro previo con correo institucional) |
| 938 | |a Askews and Holts Library Services |b ASKH |n AH33834757 | ||
| 938 | |a Askews and Holts Library Services |b ASKH |n AH24637628 | ||
| 938 | |a EBL - Ebook Library |b EBLB |n EBL1375195 | ||
| 938 | |a ebrary |b EBRY |n ebr10784220 | ||
| 938 | |a EBSCOhost |b EBSC |n 654039 | ||
| 938 | |a Taylor & Francis |b TAFR |n CRC0KE11338PDF | ||
| 938 | |a Taylor & Francis |b TAFR |n 9781315217819 | ||
| 938 | |a YBP Library Services |b YANK |n 7284166 | ||
| 994 | |a 92 |b IZTAP | ||