Testing for small-delay defects in nanoscale CMOS integrated circuits /
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality is...
Clasificación: | Libro Electrónico |
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Otros Autores: | , |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Boca Raton :
CRC Press, Taylor & Francis Group,
[2014]
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Colección: | Devices, circuits, and systems.
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Temas: | |
Acceso en línea: | Texto completo (Requiere registro previo con correo institucional) |