Electronic failure analysis handbook : techniques and applications for electronic and electrical packages, components, and assemblies /

"In the Electronic Failure Analysis Handbook, you'll find top-to-bottom coverage of this rapidly developing field, encompassing breakthrough techniques and technologies for both components and systems reliability testing, performance evaluation, and liability avoidance."--Jacket.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Martin, Perry L. (Autor)
Otros Autores: Dylls, D. David, Medora, Noshirwan K., Le May, Ian, Ludwig, Lawrence L., Kaplan, Herbert, Kessler, L. W., Semmens, J. E., Roche, David J., Erickson, J. J., Devaney, John R., Van Westerhuyzen, Dennis H., Vettraino, L. G., Blanchard, Richard A., Galler, Donald, Glover, Duncan, Kusko, Alexander, Loud, John D., Mimmack, Gregory J., Slenski, George, Denson, William, Muller, Gunter, Dunbar, William G.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, N.Y. : McGraw-Hill Education, [2000]
Edición:First edition.
Colección:McGraw-Hill's AccessEngineering.
Temas:
Electronic apparatus and appliances > Reliability.
System failures (Engineering)
Microelectronics.
Semiconductors.
Acoustic imaging.
Infrared photography.
Electron microscopy.
X-ray microscopy.
Metallography.
Semiconductors > Defects.
Solder and soldering.
Printed circuits.
Electronic apparatus and appliances > Defects.
Electronics > Materials > Defects.
Electronic books.
Acceso en línea:Texto completo

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