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Tribute to James C. Wyant: The Extraordinaire in Optical Metrology and Optics Education

Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. The papers in this volume were part of the technical conference on Tribute to James C. Wyant: The Extraordinaire in Optical Metrology and Optics Educati...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Formato: Electrónico eBook
Idioma:Indeterminado
Publicado: SPIE / International Society for Optical Engineering 2021.
Temas:
Acceso en línea:Texto completo

MARC

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