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Tribute to James C. Wyant: The Extraordinaire in Optical Metrology and Optics Education
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature. The papers in this volume were part of the technical conference on Tribute to James C. Wyant: The Extraordinaire in Optical Metrology and Optics Educati...
| Clasificación: | Libro Electrónico |
|---|---|
| Formato: | Electrónico eBook |
| Idioma: | Indeterminado |
| Publicado: |
SPIE / International Society for Optical Engineering
2021.
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| Temas: | |
| Acceso en línea: | Texto completo |