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Measurement technology and intelligent instruments IX : selected papers of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), June 29-July 2, 2009, Saint-Petersburg, Russia /
This special collection focuses on measurement science and metrology: micro- and nano- measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, indus...
| Clasificación: | Libro Electrónico |
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| Autor Corporativo: | |
| Otros Autores: | |
| Formato: | Electrónico Congresos, conferencias eBook |
| Idioma: | Inglés |
| Publicado: |
Stafa-Zuerich ; Enfield, NH :
Trans Tech Publications,
©2010.
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| Colección: | Key engineering materials ;
v. 437. |
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Measurement Technology and Intelligent Instruments IX; Preface; Sponsors and Committees; List of Reviewers; Table of Contents; I. General Problems of Measurement; Principles of Bayesian Methods in Data Analysis; Dynamic Pressure Calibration of Pressure Sensors Using Liquid Step Pressure Generator; Topical Tasks of Metrology due to Measuring Instruments Computerization; Multivariant System of Perspectives; II. Micro- / Nanomeasurements and Metrology; Coherent Optical Method for Studies of Nanoscale Objects in Liquid Media Based upon Spatial Averaging of Data.
- Measurement and Visualization of Dynamics of Piezoelectric MicrocantileverMicrorelief Measurements for White-Light Interferometer with Adaptive Algorithm Interferogram Processing; Model-Based Correction of Image Distortion in Scanning Electron Microscopy; Motif Parameters Based Characterization of Line Edge Roughness of a Nanoscale Grating Structure; Nanorelief Measurements Errors for a White-Light Interferometer with Chromatic Aberrations; Fabrication of Large Grating by Monitoring the Latent Fringe Pattern; Design and Analysis of a 6-DOF Monolithic Nanopositioning Stage.
- In Situ Mechanical Property Measurement of Titania NanowiresIII. Optical and X-Ray Tomography and Interferometry; Computed Tomography for Application in Manufacturing Metrology; Achieving Traceability of Industrial Computed Tomography; Developments in Homodyne Interferometry; Development of Innovative Fringe Locking Strategies for Vibration-Resistant White Light Vertical Scanning Interferometry (VSI); Compensation of Tilt Angles and Verification of Displacement Measurements with a Fabry-Perot Interferometer.
- A Compact Signal Processing with Position Sensitive Detectors Utilized for Michelson InterferometerImprovement on Measuring Optical Nonlinear Phase Shift by Self-Aligned Interferometer ; Programmable Holographic Optical Elements as Adaptive Optics in Optical Diagnostics Devices; High-Resolution Dimensional Metrology for Industrial Applications; IV. Measurements for Geometrical and Mechanical Quantities; Traceability for Areal Surface Texture Measurement; Industrial Applications of Image Based Measurement Techniques in Aerodynamics
- Problems, Progress and Future Needs.
- Development of a Print-Through Phenomenon Measurement System Using the Fringe Reflection Method for the Fiber Reinforced PlasticsMicro Coordinate Measuring Machine for Parallel Measurement of Microstructures; Machine Vision for Surface Roughness Assessment of Inclined Components; Fractal Geometry Surface Modeling and Measurement for Musical Cymbal Surface Texture Design and Rapid Manufacturing; Final Results of the Geometrical Calibration of the Pressure Balances to be Used for the new Determination of the Boltzmann Constant; 3D Inspection of Fuel Assembly Components.