Measurement technology and intelligent instruments IX : selected papers of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), June 29-July 2, 2009, Saint-Petersburg, Russia /

This special collection focuses on measurement science and metrology: micro- and nano- measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, indus...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: International Symposium on Measurement Technology and Intelligent Instruments Saint Petersburg, Russia
Otros Autores: Chugui, Yuri V.
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Stafa-Zuerich ; Enfield, NH : Trans Tech Publications, ©2010.
Colección:Key engineering materials ; v. 437.
Temas:
Engineering instruments > Congresses.
Measuring instruments > Congresses.
Ingénierie > Instruments > Congrès.
Mesure > Instruments > Congrès.
Engineering instruments.
Measuring instruments.
Conference papers and proceedings.
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