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Measurement technology and intelligent instruments IX : selected papers of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), June 29-July 2, 2009, Saint-Petersburg, Russia /
This special collection focuses on measurement science and metrology: micro- and nano- measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, indus...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor Corporativo: | |
| Otros Autores: | |
| Formato: | Electrónico Congresos, conferencias eBook |
| Idioma: | Inglés |
| Publicado: |
Stafa-Zuerich ; Enfield, NH :
Trans Tech Publications,
©2010.
|
| Colección: | Key engineering materials ;
v. 437. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 111 | 2 | |a International Symposium on Measurement Technology and Intelligent Instruments |n (9th : |d 2009 : |c Saint Petersburg, Russia) | |
| 245 | 1 | 0 | |a Measurement technology and intelligent instruments IX : |b selected papers of the 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), June 29-July 2, 2009, Saint-Petersburg, Russia / |c edited by Yuri Chugui [and others]. |
| 246 | 3 | 0 | |a 9th International Symposium on Measurement Technology and Intelligent Instruments |
| 246 | 3 | |a Ninth International Symposium on Measurement Technology and Intelligent Instruments | |
| 246 | 3 | 0 | |a International Symposium on Measurement Technology and Intelligent Instruments |
| 246 | 3 | 0 | |a ISMTII-2009 |
| 260 | |a Stafa-Zuerich ; |a Enfield, NH : |b Trans Tech Publications, |c ©2010. | ||
| 300 | |a 1 online resource (xx, 656 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Key engineering materials, |x 1013-9826 ; |v v. 437 | |
| 504 | |a Includes bibliographical references and index. | ||
| 588 | 0 | |a Print version record. | |
| 520 | |a This special collection focuses on measurement science and metrology: micro- and nano- measurements; novel measurement methods and diagnostic technologies, including non-destructive and dimensional inspection, optical and X-ray tomography and interferometry, terahertz technologies for science, industry and biomedicine, intelligent measuring instruments and systems for industry and transport, measurements of geometrical and mechanical quantities, measurements and metrology for humanitarian fields and education in measurement science. The aim was to present the current state and evolution of measuring technology and intelligent instruments, to highlight novel technologies for science, industry and engineering, and to spot promising ways towards further development, of new technologies for measurement, at the international level. | ||
| 505 | 0 | |a Measurement Technology and Intelligent Instruments IX; Preface; Sponsors and Committees; List of Reviewers; Table of Contents; I. General Problems of Measurement; Principles of Bayesian Methods in Data Analysis; Dynamic Pressure Calibration of Pressure Sensors Using Liquid Step Pressure Generator; Topical Tasks of Metrology due to Measuring Instruments Computerization; Multivariant System of Perspectives; II. Micro- / Nanomeasurements and Metrology; Coherent Optical Method for Studies of Nanoscale Objects in Liquid Media Based upon Spatial Averaging of Data. | |
| 505 | 8 | |a Measurement and Visualization of Dynamics of Piezoelectric MicrocantileverMicrorelief Measurements for White-Light Interferometer with Adaptive Algorithm Interferogram Processing; Model-Based Correction of Image Distortion in Scanning Electron Microscopy; Motif Parameters Based Characterization of Line Edge Roughness of a Nanoscale Grating Structure; Nanorelief Measurements Errors for a White-Light Interferometer with Chromatic Aberrations; Fabrication of Large Grating by Monitoring the Latent Fringe Pattern; Design and Analysis of a 6-DOF Monolithic Nanopositioning Stage. | |
| 505 | 8 | |a In Situ Mechanical Property Measurement of Titania NanowiresIII. Optical and X-Ray Tomography and Interferometry; Computed Tomography for Application in Manufacturing Metrology; Achieving Traceability of Industrial Computed Tomography; Developments in Homodyne Interferometry; Development of Innovative Fringe Locking Strategies for Vibration-Resistant White Light Vertical Scanning Interferometry (VSI); Compensation of Tilt Angles and Verification of Displacement Measurements with a Fabry-Perot Interferometer. | |
| 505 | 8 | |a A Compact Signal Processing with Position Sensitive Detectors Utilized for Michelson InterferometerImprovement on Measuring Optical Nonlinear Phase Shift by Self-Aligned Interferometer ; Programmable Holographic Optical Elements as Adaptive Optics in Optical Diagnostics Devices; High-Resolution Dimensional Metrology for Industrial Applications; IV. Measurements for Geometrical and Mechanical Quantities; Traceability for Areal Surface Texture Measurement; Industrial Applications of Image Based Measurement Techniques in Aerodynamics -- Problems, Progress and Future Needs. | |
| 505 | 8 | |a Development of a Print-Through Phenomenon Measurement System Using the Fringe Reflection Method for the Fiber Reinforced PlasticsMicro Coordinate Measuring Machine for Parallel Measurement of Microstructures; Machine Vision for Surface Roughness Assessment of Inclined Components; Fractal Geometry Surface Modeling and Measurement for Musical Cymbal Surface Texture Design and Rapid Manufacturing; Final Results of the Geometrical Calibration of the Pressure Balances to be Used for the new Determination of the Boltzmann Constant; 3D Inspection of Fuel Assembly Components. | |
| 590 | |a Knovel |b ACADEMIC - Nondestructive Testing & Evaluation | ||
| 590 | |a Knovel |b ACADEMIC - Manufacturing Engineering | ||
| 650 | 0 | |a Engineering instruments |v Congresses. | |
| 650 | 0 | |a Measuring instruments |v Congresses. | |
| 650 | 6 | |a Ingénierie |x Instruments |v Congrès. | |
| 650 | 6 | |a Mesure |x Instruments |v Congrès. | |
| 650 | 7 | |a Engineering instruments. |2 fast |0 (OCoLC)fst00910572 | |
| 650 | 7 | |a Measuring instruments. |2 fast |0 (OCoLC)fst01013181 | |
| 655 | 7 | |a Conference papers and proceedings. |2 fast |0 (OCoLC)fst01423772 | |
| 700 | 1 | |a Chugui, Yuri V. | |
| 776 | 0 | 8 | |i Print version: |a International Symposium on Measurement Technology and Intelligent Instruments (9th : 2009 : Saint Petersburg, Russia). |t Measurement technology and intelligent instruments IX. |d Stafa-Zuerich ; Enfield, NH : Trans Tech Publications Ltd., ©2010 |z 0878492739 |w (OCoLC)650791268 |
| 830 | 0 | |a Key engineering materials ; |v v. 437. | |
| 856 | 4 | 0 | |u https://appknovel.uam.elogim.com/kn/resources/kpMTIIIX07/toc |z Texto completo |
| 938 | |a Trans Tech Publications, Ltd |b TRAN |n 10.4028/www.scientific.net/KEM.437 | ||
| 938 | |a ProQuest Ebook Central |b EBLB |n EBL1872424 | ||
| 938 | |a ebrary |b EBRY |n ebr10604215 | ||
| 994 | |a 92 |b IZTAP | ||