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Characterization in silicon processing /
This volume is devoted to the consideration of the use use of surface, thin film and interface characterization tools in support of silicon-based semiconductor processing. The approach taken is to consider each of the types of films used in silicon devices individually in its own chapter and to disc...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Boston : Greenwich :
Butterworth-Heinemann ; Manning,
©1993.
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| Colección: | Materials characterization series.
|
| Temas: | |
| Acceso en línea: | Texto completo |
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por Strausser, Yale
Publicado 2013
Texto completo (Requiere registro previo con correo institucional)
Publicado 2013
Electrónico
eBook
Search Result 2