Electronics reliability and measurement technology : nondestructive evaluation /

Mostrar otras versiones (1)

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Heyman, Joseph S.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988.
Temas:
Integrated circuits > Reliability > Congresses.
Nondestructive testing > Congresses.
Integrated circuits > Testing > Congresses.
Circuits intégrés > Fiabilité > Congrès.
Contrôle non destructif > Congrès.
TECHNOLOGY & ENGINEERING > Electronics > Microelectronics.
TECHNOLOGY & ENGINEERING > Electronics > Digital.
Integrated circuits > Reliability.
Integrated circuits > Testing.
Nondestructive testing.
Elektronik
Elektronische Schaltung
Kongress
Zuverlässigkeit
Conference papers and proceedings.
Actes de congrès.
Hampton (Va., 1986)
Acceso en línea:Texto completo

Internet

Texto completo

Items no disponibles

Detalle de Existencias desde

Ejemplares similares