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Truth and traceability in physics and metrology /
Metrological data is known to be blurred by the imperfections of the measuring process. In retrospect, for about two centuries regular or constant errors were no focal point of experimental activities, only irregular or random error were. Today's notation of unknown systematic errors is in line...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) :
Morgan & Claypool Publishers,
[2018]
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| Colección: | IOP (Series). Release 5.
IOP concise physics. |
| Temas: | |
| Acceso en línea: | Texto completo |