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Secondary ion mass spectrometry : applications for depth profiling and surface characterization /
Secondary ion mass spectrometry (SIMS) is a mass spectrometric technique for solid materials that can provide elemental analysis at parts per million sensitivity and lateral resolution of 50 nm. When those capabilities are combined with the ability to provide that analysis as a function of depth, SI...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York [New York] (222 East 46th Street, New York, NY 10017) :
Momentum Press,
2016.
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| Colección: | Materials characterization and analysis collection.
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| Temas: | |
| Acceso en línea: | Texto completo |