Gettering and defect engineering in semiconductor technology XIII : GADEST 2009 : proceedings of the XIIIth International Autumn Meeting, Dölnsee-Schorfheide, north of Berlin, Germany, September 26-October 02, 2009 /
This collection aims to address the fundamental aspects, as well as the technological problems, which are associated with defects in electronic materials and devices. The volume comprises 93 contributions; among them, 14 invited papers, from more than 20 different countries. The invited papers, subm...
Clasificación: | Libro Electrónico |
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Autor Corporativo: | |
Otros Autores: | , |
Formato: | Electrónico Congresos, conferencias eBook |
Idioma: | Inglés |
Publicado: |
Stafa-Zuerich, Switzerland :
Trans Tech Publications,
©2010.
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Colección: | Diffusion and defect data. Solid state phenomena ;
v. 156/158. |
Temas: | |
Acceso en línea: | Texto completo |