Cargando…

Gettering and defect engineering in semiconductor technology XIII : GADEST 2009 : proceedings of the XIIIth International Autumn Meeting, Dölnsee-Schorfheide, north of Berlin, Germany, September 26-October 02, 2009 /

This collection aims to address the fundamental aspects, as well as the technological problems, which are associated with defects in electronic materials and devices. The volume comprises 93 contributions; among them, 14 invited papers, from more than 20 different countries. The invited papers, subm...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: International Autumn Meeting "Gettering and Defect Engineering in Semiconductor Technology" Dölnsee-Schorfheide, Germany
Otros Autores: Kittler, Martin, Richter, H., 1940-
Formato: Electrónico Congresos, conferencias eBook
Idioma:Inglés
Publicado: Stafa-Zuerich, Switzerland : Trans Tech Publications, ©2010.
Colección:Diffusion and defect data. Solid state phenomena ; v. 156/158.
Temas:
Acceso en línea:Texto completo