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X-ray scattering from semiconductors /
This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the tech...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
London :
Imperial College Press,
©2003.
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| Edición: | 2nd ed. |
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Copyright; Preface; Contents; 1
- An Introduction to Semiconductor Materials; 2
- An Introduction to X-Ray Scattering; 3
- Equipment for Measuring Diffraction Patterns; 4
- A Practical Guide to the Evaluation of Structural Parameters; Appendix 1; Subject Index.