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X-ray scattering from semiconductors /

This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the tech...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Fewster, Paul F.
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London : Imperial College Press, ©2003.
Edición:2nd ed.
Temas:
Acceso en línea:Texto completo