X-ray scattering from semiconductors /
This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the tech...
Clasificación: | Libro Electrónico |
---|---|
Autor principal: | Fewster, Paul F. |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
London :
Imperial College Press,
©2003.
|
Edición: | 2nd ed. |
Temas: | |
Acceso en línea: | Texto completo |
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