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X-ray scattering from semiconductors /
This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the tech...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
London :
Imperial College Press,
©2003.
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| Edición: | 2nd ed. |
| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | This book presents a practical guide to the analysis of materials and includes a thorough description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general. Semiconductors can be very perfect composite crystals and therefore their study can lead to the largest volume of information, since X-ray scattering can assess the deviation from perfection. |
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| Descripción Física: | 1 online resource (xiv, 299 pages) : illustrations |
| Bibliografía: | Includes bibliographical references and index. |
| ISBN: | 1860944582 9781860944581 |