Fringe pattern analysis for optical metrology : theory, algorithms, and applications /

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presen...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Servín, Manuel (Autor), Quiroga, J. Antonio (Juan Antonio) (Autor), Padilla, J. Moisés (José Moisés) (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Weinheim : Wiley-VCH, [2014]
Edición:First edition.
Temas:
Interferometry.
Diffraction patterns.
Optical measurements.
Interferometry
Interférométrie.
Figures de diffraction.
Mesures optiques.
SCIENCE > Energy.
SCIENCE > Mechanics > General.
SCIENCE > Physics > General.
Diffraction patterns
Optical measurements
Interferometrie
Beugungsfigur
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