Cargando…

Electromigration in ULSI interconnections /

Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on electromigration in ULSI interconnections. It begins with the basic knowledge required for a detailed study on elect...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Tan, Cher Ming, 1959-
Autor Corporativo: World Scientific (Firm)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Singapore ; Hackensack, N.J. : World Scientific Pub. Co., ©2010.
Colección:International series on advances in solid state electronics and technology.
Temas:
Acceso en línea:Texto completo