Cargando…
Advanced mathematical & computational tools in metrology & testing VIII /
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review v...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores Corporativos: | , |
| Otros Autores: | |
| Formato: | Electrónico Congresos, conferencias eBook |
| Idioma: | Inglés |
| Publicado: |
Singapore ; Hackensack, N.J. :
World Scientific,
©2009.
|
| Colección: | Series on advances in mathematics for applied sciences ;
v. 78. |
| Temas: | |
| Acceso en línea: | Texto completo |