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Design for at-speed test, diagnosis, and measurement /
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how...
| Clasificación: | Libro Electrónico |
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| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Boston :
Kluwer Academic,
©2000.
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| Colección: | Frontiers in electronic testing.
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| Temas: | |
| Acceso en línea: | Texto completo |