Design for at-speed test, diagnosis, and measurement /

Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Nadeau-Dostie, Benoit
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Boston : Kluwer Academic, ©2000.
Colección:Frontiers in electronic testing.
Temas:
Integrated circuits > Testing.
Electronic apparatus and appliances > Testing.
Circuits intégrés > Essais.
Appareils électroniques > Essais.
TECHNOLOGY & ENGINEERING > Telecommunications.
Electronic apparatus and appliances > Testing
Integrated circuits > Testing
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