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Variation-Aware Advanced CMOS Devices and SRAM
This book provides a comprehensive overview of contemporary issues in complementary metal-oxide semiconductor (CMOS) device design, describing how to overcome process-induced random variations such as line-edge-roughness, random-dopant-fluctuation, and work-function variation, and the applications o...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Dordrecht :
Springer Netherlands : Imprint: Springer,
2016.
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| Edición: | 1st ed. 2016. |
| Colección: | Springer Series in Advanced Microelectronics,
56 |
| Temas: | |
| Acceso en línea: | Texto Completo |
Tabla de Contenidos:
- 1 Introduction and Overview
- 2 Understanding of Process-Induced Random Variation
- 3 Various Variation-Robust CMOS Device Designs
- 4 Applications to Static Random Access Memory (SRAM)
- 5 Conclusion.