Stochastic Process Variation in Deep-Submicron CMOS Circuits and Algorithms /

One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Zjajo, Amir (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2014.
Edición:1st ed. 2014.
Colección:Springer Series in Advanced Microelectronics, 48
Temas:
Electronic circuits.
System theory.
Engineering mathematics.
Engineering-Data processing.
Biomathematics.
Mathematical physics.
Electronic Circuits and Systems.
Complex Systems.
Mathematical and Computational Engineering Applications.
Mathematical and Computational Biology.
Theoretical, Mathematical and Computational Physics.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • 1 Introduction
  • 2 Random Process Variation in Deep-Submicron CMOS
  • 3 Electronic Noise in Deep-Submicron CMOS
  • 4 Thermal Effects in Deep-Submicron CMOS
  • 5 Circuit Solutions
  • 6 Conclusions and Recommendations
  • Appendix. References
  • Acknowledgement
  • About the Author.

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