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Stochastic Process Variation in Deep-Submicron CMOS Circuits and Algorithms /
One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control...
| Clasificación: | Libro Electrónico |
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| Autor principal: | |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Dordrecht :
Springer Netherlands : Imprint: Springer,
2014.
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| Edición: | 1st ed. 2014. |
| Colección: | Springer Series in Advanced Microelectronics,
48 |
| Temas: | |
| Acceso en línea: | Texto Completo |