Cargando…
Stochastic Process Variation in Deep-Submicron CMOS Circuits and Algorithms /
One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Dordrecht :
Springer Netherlands : Imprint: Springer,
2014.
|
| Edición: | 1st ed. 2014. |
| Colección: | Springer Series in Advanced Microelectronics,
48 |
| Temas: | |
| Acceso en línea: | Texto Completo |
MARC
| LEADER | 00000nam a22000005i 4500 | ||
|---|---|---|---|
| 001 | 978-94-007-7781-1 | ||
| 003 | DE-He213 | ||
| 005 | 20220120062929.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 131113s2014 ne | s |||| 0|eng d | ||
| 020 | |a 9789400777811 |9 978-94-007-7781-1 | ||
| 024 | 7 | |a 10.1007/978-94-007-7781-1 |2 doi | |
| 050 | 4 | |a TK7867-7867.5 | |
| 072 | 7 | |a TJFC |2 bicssc | |
| 072 | 7 | |a TEC008010 |2 bisacsh | |
| 072 | 7 | |a TJFC |2 thema | |
| 082 | 0 | 4 | |a 621.3815 |2 23 |
| 100 | 1 | |a Zjajo, Amir. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 245 | 1 | 0 | |a Stochastic Process Variation in Deep-Submicron CMOS |h [electronic resource] : |b Circuits and Algorithms / |c by Amir Zjajo. |
| 250 | |a 1st ed. 2014. | ||
| 264 | 1 | |a Dordrecht : |b Springer Netherlands : |b Imprint: Springer, |c 2014. | |
| 300 | |a XIX, 192 p. 46 illus. |b online resource. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a text file |b PDF |2 rda | ||
| 490 | 1 | |a Springer Series in Advanced Microelectronics, |x 2197-6643 ; |v 48 | |
| 505 | 0 | |a 1 Introduction -- 2 Random Process Variation in Deep-Submicron CMOS -- 3 Electronic Noise in Deep-Submicron CMOS -- 4 Thermal Effects in Deep-Submicron CMOS -- 5 Circuit Solutions -- 6 Conclusions and Recommendations -- Appendix. References -- Acknowledgement -- About the Author. | |
| 520 | |a One of the most notable features of nanometer scale CMOS technology is the increasing magnitude of variability of the key device parameters affecting performance of integrated circuits. The growth of variability can be attributed to multiple factors, including the difficulty of manufacturing control, the emergence of new systematic variation-generating mechanisms, and most importantly, the increase in atomic-scale randomness, where device operation must be described as a stochastic process. In addition to wide-sense stationary stochastic device variability and temperature variation, existence of non-stationary stochastic electrical noise associated with fundamental processes in integrated-circuit devices represents an elementary limit on the performance of electronic circuits. In an attempt to address these issues, Stochastic Process Variation in Deep-Submicron CMOS: Circuits and Algorithms offers unique combination of mathematical treatment of random process variation, electrical noise and temperature and necessary circuit realizations for on-chip monitoring and performance calibration. The associated problems are addressed at various abstraction levels, i.e. circuit level, architecture level and system level. It therefore provides a broad view on the various solutions that have to be used and their possible combination in very effective complementary techniques for both analog/mixed-signal and digital circuits. The feasibility of the described algorithms and built-in circuitry has been verified by measurements from the silicon prototypes fabricated in standard 90 nm and 65 nm CMOS technology. . | ||
| 650 | 0 | |a Electronic circuits. | |
| 650 | 0 | |a System theory. | |
| 650 | 0 | |a Engineering mathematics. | |
| 650 | 0 | |a Engineering-Data processing. | |
| 650 | 0 | |a Biomathematics. | |
| 650 | 0 | |a Mathematical physics. | |
| 650 | 1 | 4 | |a Electronic Circuits and Systems. |
| 650 | 2 | 4 | |a Complex Systems. |
| 650 | 2 | 4 | |a Mathematical and Computational Engineering Applications. |
| 650 | 2 | 4 | |a Mathematical and Computational Biology. |
| 650 | 2 | 4 | |a Theoretical, Mathematical and Computational Physics. |
| 710 | 2 | |a SpringerLink (Online service) | |
| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9789400777828 |
| 776 | 0 | 8 | |i Printed edition: |z 9789400777804 |
| 776 | 0 | 8 | |i Printed edition: |z 9789402402858 |
| 830 | 0 | |a Springer Series in Advanced Microelectronics, |x 2197-6643 ; |v 48 | |
| 856 | 4 | 0 | |u https://doi.uam.elogim.com/10.1007/978-94-007-7781-1 |z Texto Completo |
| 912 | |a ZDB-2-ENG | ||
| 912 | |a ZDB-2-SXE | ||
| 950 | |a Engineering (SpringerNature-11647) | ||
| 950 | |a Engineering (R0) (SpringerNature-43712) | ||