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Accelerating Test, Validation and Debug of High Speed Serial Interfaces

High-Speed Serial Interface (HSSI) devices have become widespread in communications, from the embedded to high-performance computing systems, and from on-chip to a wide haul. Testing of HSSIs has been a challenging topic because of signal integrity issues, long test time and the need of expensive in...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Fan, Yongquan (Autor), Zilic, Zeljko (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2011.
Edición:1st ed. 2011.
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Acceso en línea:Texto Completo

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