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Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the c...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Singhee, Amith (Autor), Rutenbar, Rob A. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Colección:Lecture Notes in Electrical Engineering, 46
Temas:
Acceso en línea:Texto Completo