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Temperature Measurement during Millisecond Annealing Ripple Pyrometry for Flash Lamp Annealers /

Denise Reichel studies the delicate subject of temperature measurement during lamp-based annealing of semiconductors, in particular during flash lamp annealing. The approach of background-correction using amplitude-modulated light to obtain the sample reflectivity is reinvented from rapid thermal an...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Reichel, Denise (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Wiesbaden : Springer Fachmedien Wiesbaden : Imprint: Springer, 2015.
Edición:1st ed. 2015.
Colección:MatWerk,
Temas:
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction and motivation.- Fundamentals of flash lamp annealing of shallow Boron-doped Silicon.- Fundamentals of surface temperature measurements during flash lamp annealing
  • Concept of ripple pyrometry during  flash lamp annealing
  •  Ripple pyrometry for flash lamp annealing.- Experiments - ripple pyrometry during flash lamp annealing.- Closing discussion and outlook.