Ellipsometry at the Nanoscale
This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology...
Clasificación: | Libro Electrónico |
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Autor Corporativo: | SpringerLink (Online service) |
Otros Autores: | Losurdo, Maria (Editor ), Hingerl, Kurt (Editor ) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2013.
|
Edición: | 1st ed. 2013. |
Temas: | |
Acceso en línea: | Texto Completo |
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