Fault Analysis in Cryptography
In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industr...
Clasificación: | Libro Electrónico |
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Autor Corporativo: | |
Otros Autores: | , |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2012.
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Edición: | 1st ed. 2012. |
Colección: | Information Security and Cryptography,
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Temas: | |
Acceso en línea: | Texto Completo |
Tabla de Contenidos:
- Part I - Introductory Material
- Chap. 1 Side-Channel Analysis and Its Relevance to Fault Attacks
- Part II Fault Analysis in Secret Key Cryptography
- Chap. 2 Attacking Block Ciphers
- Chap. 3 Differential Fault Analysis of DES
- Chap. 4 Differential Fault Analysis of the Advanced Encryption Standard
- Chap. 5 Countermeasures for Symmetric-Key Ciphers
- Chap. 6 On Countermeasures Against Fault Attacks on Advanced Encryption Standard
- Part III Fault Analysis in Public Key Cryptography
- Chap. 7 A Survey of Differential Fault Analysis Against Classical RSA Implementations
- Chap. 8 Fault Attacks Against RSA-CRT Implementation
- Chap. 9 Fault Attacks on Elliptic Curve Cryptosystems
- Chap. 10 On Countermeasures Against Fault Attacks on Elliptic Curve Cryptography Using Fault Detection
- Chap. 11 Design of Cryptographic Devices Resilient to Fault Injection Attacks Using Nonlinear Robust Codes
- Chap. 12 Lattice-Based Fault Attacks on Signatures
- Chap. 13 Fault Attacks on Pairing Based Cryptography
- Part IV Miscellaneous
- Chap. 14 Fault Attacks on Stream Ciphers
- Chap. 15 Interaction Between Fault Attack Countermeasures and the Resistance Against Power Analysis Attacks
- Part V Implementing Fault Attacks
- Chap. 16 Injection Technologies for Fault Attacks on Microprocessors
- Chap. 17 Global Faults on Cryptographic Circuits
- Chap. 18 Fault Injection and Key Retrieval Experiments on an Evaluation Board
- References.