Fault Analysis in Cryptography
In the 1970s researchers noticed that radioactive particles produced by elements naturally present in packaging material could cause bits to flip in sensitive areas of electronic chips. Research into the effect of cosmic rays on semiconductors, an area of particular interest in the aerospace industr...
Clasificación: | Libro Electrónico |
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Autor Corporativo: | SpringerLink (Online service) |
Otros Autores: | Joye, Marc (Editor ), Tunstall, Michael (Editor ) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2012.
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Edición: | 1st ed. 2012. |
Colección: | Information Security and Cryptography,
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Temas: | |
Acceso en línea: | Texto Completo |
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