Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments /

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-m...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Xie, Hui (Autor), Onal, Cagdas (Autor), Régnier, Stéphane (Autor), Sitti, Metin (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2012.
Edición:1st ed. 2012.
Colección:Springer Tracts in Advanced Robotics, 71
Temas:
Control engineering.
Robotics.
Automation.
Artificial intelligence.
Microtechnology.
Microelectromechanical systems.
Control, Robotics, Automation.
Artificial Intelligence.
Microsystems and MEMS.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Descriptions and challenges of AFM based nanorobotic systems
  • Instrumentation issues of an AFM based nanorobotic system
  • Nanomechanics of AFM based nanomanipulation
  • Teleoperation based AFM manipulation control
  • Automated control of AFM based nanomanipulation
  • Applications of AFM based nanorobotic systems.

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