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Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments /

The atomic force microscope (AFM) has been successfully used to perform nanorobotic manipulation operations on nanoscale entities such as particles, nanotubes, nanowires, nanocrystals, and DNA since 1990s. There have been many progress on modeling, imaging, teleoperated or automated control, human-m...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Xie, Hui (Autor), Onal, Cagdas (Autor), Régnier, Stéphane (Autor), Sitti, Metin (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2012.
Edición:1st ed. 2012.
Colección:Springer Tracts in Advanced Robotics, 71
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Acceso en línea:Texto Completo

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