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Noncontact Atomic Force Microscopy Volume 2 /

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and...

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Detalles Bibliográficos
Clasificación:	Libro Electrónico
Autor Corporativo:	SpringerLink (Online service)
Otros Autores:	Morita, Seizo (Editor ), Giessibl, Franz J. (Editor ), Wiesendanger, Roland (Editor )
Formato:	Electrónico eBook
Idioma:	Inglés
Publicado:	Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009.
Edición:	1st ed. 2009.
Colección:	NanoScience and Technology,
Temas:	Microtechnology. Microelectromechanical systems. Spectrum analysis. Mechanics, Applied. Nanotechnology. Engineering. Condensed matter. Microsystems and MEMS. Spectroscopy. Engineering Mechanics. Technology and Engineering. Condensed Matter Physics.
Acceso en línea:	Texto Completo

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