Noncontact Atomic Force Microscopy Volume 2 /

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Morita, Seizo (Editor ), Giessibl, Franz J. (Editor ), Wiesendanger, Roland (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Colección:NanoScience and Technology,
Temas:
Microtechnology.
Microelectromechanical systems.
Spectrum analysis.
Mechanics, Applied.
Nanotechnology.
Engineering.
Condensed matter.
Microsystems and MEMS.
Spectroscopy.
Engineering Mechanics.
Technology and Engineering.
Condensed Matter Physics.
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