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Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings /

Detalles Bibliográficos
Clasificación:	Libro Electrónico
Autor Corporativo:	SpringerLink (Online service)
Otros Autores:	Yeung, Dit-Yan (Editor ), Kwok, James T. (Editor ), Fred, Ana (Editor ), Roli, Fabio (Editor ), de Ridder, Dick (Editor )
Formato:	Electrónico eBook
Idioma:	Inglés
Publicado:	Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2006.
Edición:	1st ed. 2006.
Colección:	Image Processing, Computer Vision, Pattern Recognition, and Graphics ; 4109
Temas:	Pattern recognition systems. Computer science-Mathematics. Discrete mathematics. Artificial intelligence. Computer graphics. Computer vision. Automated Pattern Recognition. Discrete Mathematics in Computer Science. Artificial Intelligence. Computer Graphics. Computer Vision.
Acceso en línea:	Texto Completo

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