Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK /

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Cullis, A.G (Editor ), Hutchison, John L. (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2005.
Edición:1st ed. 2005.
Colección:Springer Proceedings in Physics, 107
Temas:
Materials science.
Electronics.
Electronic circuits.
Condensed matter.
Spectrum analysis.
Measurement.
Measuring instruments.
Materials Science.
Electronics and Microelectronics, Instrumentation.
Electronic Circuits and Systems.
Condensed Matter Physics.
Spectroscopy.
Measurement Science and Instrumentation.
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