Helium Ion Microscopy

This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. It also provides first hand information on nanofabrication and high resolution imaging. Relevant theoretical models and the existing simulation approaches are di...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Hlawacek, Gregor (Editor ), Gölzhäuser, Armin (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Cham : Springer International Publishing : Imprint: Springer, 2016.
Edición:1st ed. 2016.
Colección:NanoScience and Technology,
Temas:
Spectrum analysis.
Surfaces (Technology).
Thin films.
Surfaces (Physics).
Microtechnology.
Microelectromechanical systems.
Spectroscopy.
Surfaces, Interfaces and Thin Film.
Surface and Interface and Thin Film.
Microsystems and MEMS.
Acceso en línea:Texto Completo

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