Cargando…
Factors Governing Tin Whisker Growth
Tin (Sn) whiskers are electrically conductive, single crystal eruptions that grow from Sn film surfaces. Their high aspect ratio presents reliability problems for the electronics industry due to bridging and metal arcing, leading to malfunctions and catastrophic failures in many electronic systems (...
| Clasificación: | Libro Electrónico |
|---|---|
| Autor principal: | |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Cham :
Springer International Publishing : Imprint: Springer,
2013.
|
| Edición: | 1st ed. 2013. |
| Colección: | Springer Theses, Recognizing Outstanding Ph.D. Research,
|
| Temas: | |
| Acceso en línea: | Texto Completo |