CMOS Test and Evaluation A Physical Perspective /

This book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and prod...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Bhushan, Manjul (Autor), Ketchen, Mark B. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2015.
Edición:1st ed. 2015.
Temas:
Electronics.
Electronic circuits.
Semiconductors.
Security systems.
Electronics and Microelectronics, Instrumentation.
Electronic Circuits and Systems.
Security Science and Technology.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Introduction
  • CMOS Circuit Basics
  • CMOS Storage Elements and Synchronous Logic
  • IDDQ and Power
  • Embedded PVT Monitors
  • Variability
  • Product Chip Test and Characterization
  • Reliability, Burn-In and Guardbands
  • Data Analysis and Characterization
  • CMOS Metrics and Model Evaluation.

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